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Title
Japanese:OFDR法を用いたウェーハレベル光集積デバイス特性検査(3) ‐O帯及びC帯Si細線導波路の分布反射係数の線幅依存性‐ 
English: 
Author
Japanese: 堀川 剛, 西山 伸彦.  
English: Tsuyoshi Horikawa, Nobuhiko Nishiyama.  
Language Japanese 
Journal/Book name
Japanese:電子情報通信学会ソサイエティ大会講演論文集 
English: 
Volume, Number, Page        
Published date Sept. 8, 2025 
Publisher
Japanese: 
English: 
Conference name
Japanese:電子情報通信学会ソサイエティ大会 
English: 
Conference site
Japanese:岡山 
English: 

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