Device Characterization via Transient Model Involving VCu–VSe Complex for Cu(In,Ga)Se2 Solar Cells

Publication Information

Title

Japanese:
English:	Device Characterization via Transient Model Involving VCu–VSe Complex for Cu(In,Ga)Se2 Solar Cells

Author

Japanese:	西村昂人, 福田遼太郎, 山田明.
English:	Takahito Nishimura, Ryotaro Fukuda, Akira Yamada.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Sept. 22, 2025

Publisher

Japanese:
English:

Conference name

Japanese:	42nd European Photovoltaic Solar Energy Conference and Exhibition
English:	42nd European Photovoltaic Solar Energy Conference and Exhibition

Conference site

Japanese:
English:	Bilbao