Demonstration of MIR detector using sputter-fabricated BiSb topological insulator film

Publication Information

Title

Japanese:
English:	Demonstration of MIR detector using sputter-fabricated BiSb topological insulator film

Author

Japanese:	西山黎, PHAM NAM HAI, 河野行雄.
English:	Hajime Nishiyama, Pham Nam Hai, Yukio Kawano.

Language

English

Journal/Book name

Japanese:
English:

Volume, Number, Page

Published date

Aug. 2026

Publisher

Japanese:
English:

Conference name

Japanese:
English:	The 37th International Conference on the Physics of Semiconductors 2026

Conference site

Japanese:
English:	Tokyo