We study the epitaxial structure and physical properties of B-site-ordered Sr2TiRuO6 double-perovskite films by pulsed-laser deposition. TheTi/Ru order was evaluated (up to 67%) from intensity profiles of the out-of-plane reflections measured using a synchrotron-light source. Theelectronic states were investigated as a function of the Ti/Ru order. A systematic increase in resistivity with the Ti/Ru order was observed, whichis associated with the localization behavior of Ru 4d electrons as verified by photoemission spectroscopy. These results suggest that theelectronic properties of Sr2TiRuO6 are strongly influenced by the 4d state connectivity between neighboring Ru atoms.