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タイトル
和文: 
英文:Simulation of an edged-illuminated refracting-facet spin photodiode 
著者
和文: Roca Ronel C I, 西沢 望, 西林 一彦, 宗片 比呂夫.  
英文: R. C. Roca, N. Nishizawa, K. Nishibayashi, H. Munekata.  
言語 English 
掲載誌/書名
和文:予稿集 
英文: 
巻, 号, ページ         p. 09-141
出版年月 2017年3月14日 
出版者
和文:公共社団法人 応用物理学会 
英文: 
会議名称
和文:第64回応用物理学会春季学術講演会 
英文:The 64th JSAP Spring Meeting, 2017 
開催地
和文:Japan 
英文:横浜 
アブストラクト We propose a novel edge-illuminated spin photoiode (spin-PD) design that utilizes a refracting facet. Unique points of the design involves, firstly, a thin active layer with a thickness less than the spin relaxation length, and secondly, a refracting facet that couples the light into the active layer. The simulations were carried out for a Fe/x-AlOx/p-InGaAs/p-GaAs Schottky diode with InGaAs as the active layer, although the design can be applied to any material system. For the case of a facet angle of 75 deg., an optimum active layer thickness of approximately 400nm was observed. At this active layer thickness, a helicty dependent photocurrent ratio of approximately 19% was calculated. This value is higher than the that of the current best in the literature.

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