Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately

論文・著書情報

タイトル

和文:
英文:	Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately

著者

和文:	星井拓也, Kazuyoshi Furukawa, 角嶋邦之, 渡辺正裕, Naoyuki Shigyo, Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi, 宗田伊理也, 若林整, Sinichi Nishizawa, 筒井一生, Toshiro Hiramoto, 大橋弘通, 岩井洋.
英文:	Takuya Hoshii, Kazuyoshi Furukawa, Kuniyuki Kakushima, Masahiro Watanabe, Naoyuki Shigyo, Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi, Iriya Muneta, Hitoshi Wakabayashi, Sinichi Nishizawa, Kazuo Tsutsui, Toshiro Hiramoto, Hiromichi Ohashi, Hiroshi Iwai.

言語

English

掲載誌/書名

和文:
英文:

巻, 号, ページ

出版年月

2018年9月

出版者

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英文:

会議名称

和文:
英文:	44th European Solid-State Circuits Conference (ESSDERC2018)

開催地

和文:
英文:	Dresden