Home >

news ヘルプ

論文・著書情報


タイトル
和文:Direct In Situ Observation of the Early-Stage Disorder窶徹rder Evolution of Perpendicular Lamellae in Thermally Annealed High-マ� Block Copolymer Thin Films 
英文:Direct In Situ Observation of the Early-Stage Disorder窶徹rder Evolution of Perpendicular Lamellae in Thermally Annealed High-マ� Block Copolymer Thin Films 
著者
和文: Alvin Chandra, Ryuichi Nakatani, Takumi Uchiyama, Yuriko Seino, Hironobu Sato, Yusuke Kasahara, Tsukasa Azuma, Teruaki Hayakawa.  
英文: Alvin Chandra, Ryuichi Nakatani, Takumi Uchiyama, Yuriko Seino, Hironobu Sato, Yusuke Kasahara, Tsukasa Azuma, Teruaki Hayakawa.  
言語 English 
掲載誌/書名
和文:Advanced Materials Interfaces 
英文:Advanced Materials Interfaces 
巻, 号, ページ Vol. 6    No. 11    pp. 1801401
出版年月 2019年4月12日 
出版者
和文:John Wiley & Sons, Ltd 
英文:John Wiley & Sons, Ltd 
会議名称
和文: 
英文: 
開催地
和文: 
英文: 
公式リンク https://doi.org/10.1002/admi.201801401
 
DOI https://doi.org/10.1002/admi.201801401
アブストラクト Abstract The evolution of well-ordered, sub-10 nm, perpendicular lamellae from a disordered state is documented directly using in situ atomic force microscopy, cross-sectional scanning electron microscopy, and grazing-incidence small angle X-ray scattering. Since block copolymer (BCP) self-assembly occurs on extremely fast time scales, directly imaging the growth of perpendicular lamellae remains challenging. The lack of understanding behind early-stage self-assembly and how metastable defects can affect the kinetic behavior near thermodynamic equilibrium prevents the realization of defect-free thin films. By characterizing the evolution of nanostructures using a high-?, perpendicular lamella-forming BCP, poly(polyhedral oligomeric silsesquioxane)-block-poly(2,2,2-trifluoroethyl methacrylate), over a wide temperature range, three stages in the evolution of perpendicular lamellae, characterized mainly by the root-mean-squared (rms) roughness, is observed. At temperatures lower than the glass transition temperatures (Tg), the film retains a smooth, disordered surface (rms roughness = 0.352 ツア 0.006 nm), characteristic of spin-coated films. Near the Tg, spinodal decomposition and the appearance of lamellae are detected as the rms roughness increases at 70 ツーC, before peaking at 82 ツーC at 0.83 nm, and decaying rapidly with increasing temperatures. Above the Tg, the rms roughness returns to 0.35 ツア 0.03 nm, as defects are observed to annihilate sequentially.

©2007 Tokyo Institute of Technology All rights reserved.