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タイトル
和文: 
英文:Improving Disturbance-Rejection Performance Using Combination of Sliding-Mode Control and Equiva-lent-Input-Disturbance Approach 
著者
和文: Zewen Wang, 余 錦華, 佐藤 大樹.  
英文: Zewen Wang, Jinhua She, Daiki Sato.  
言語 English 
掲載誌/書名
和文: 
英文:48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference 
巻, 号, ページ        
出版年月 2022年10月17日 
出版者
和文: 
英文: 
会議名称
和文: 
英文:48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference 
開催地
和文: 
英文: 
アブストラクト This paper combines the equivalent-input-disturbance (EID) approach with the sliding-mode control (SMC) approach that improves disturbance-rejection performance. A novel equivalent-input-disturbance (NEID) approach is presented, which considers the disturbance estimation in the state observer. A sliding surface is designed based on the internal model principle, which is called internal-model sliding-mode control (IMSMC). A stability condition is devised for the SMC-EID-based control system. The parameters are designed based on the stability condition. Simulation results show the validity of the NEID approach.

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