""Chunmeng Dou","Tomoya Shoji","Kazuhiro Nakajima","Kuniyuki Kakushima","Parhat Ahmet","Yoshinori Kataoka","Akira Nishiyama","Nobuyuki Sugii","Hitoshi Wakabayashi","Kazuo Tsutsui","Kenji Natori","Hiroshi Iwai"","Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement",,"Microelectronics Reliability",,"Vol. 54",,"pp. 725-729",2014,Apr.