"Kiichi Tachi,S. Barraud,Kuniyuki KAKUSHIMA,HIROSHI IWAI,S. Cristoloveanu,T. Ernst","Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs",,"Microelectronics Reliability",,"Vol. 51",,"pp. 885-888",2011,May