"Hidekazu Takahashi,Hiroki Ogura,Shimpei Sato,Atsushi Takahashi,Chikaaki Kodama","A feature selection method for weak classifier based hotspot detection",,"Proc. SPIE 11328, Design-Process-Technology Co-optimization for Manufacturability XIV, 113281E",,,,"pp. 1-7",2020,Mar.
"小椋弘貴,高橋秀和,佐藤真平,高橋篤司","ホットスポットテストケースに用いられるデータベースの分析",,"電子情報通信学会技術研究報告",,"Vol. 119","No. 282","pp. 191-196",2019,Nov.
"Atsushi Takahashi,Hidekazu Takahashi,Hiroki Ogura,Shimpei Sato","Hotspot Detection Methods and their Evaluation in Advanced Lithography",,"Proc. the 16th International SoC Design Conference (ISOCC '19)",,,,"p. 121",2019,Oct.
"Atsushi Takahashi,Shimpei Sato,Hiroki Ogura,Yu-Min Sung,Ting-Chi Wang","Pattern Similarity Metrics for Layout Pattern Classification and their Validity Analysis by Lithographic Responses",,"Proc. 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)",,,,"pp. 494-497",2018,July