"Shi Yuhao,Shiah Yu-Shien,Sim Kihyung,Sasase Masato,Kim Junghwan,Hosono Hideo","High-performance a-ITZO TFTs with high bias stability enabled by self-aligned passivation using a-GaOx",,,,,,,2022,Nov.
"Junghwan Kim,Yu-Shien Shiah,Kihyung Sim,Soshi Iimura,Katsumi Abe,Masatake Tsuji,Masato Sasase,Hideo Hosono","High-Performance P-Channel Tin Halide Perovskite Thin Film Transistor Utilizing a 2D?3D Core?Shell Structure",,"Advanced Science",,,,,2021,Dec.
"Yu-Shien Shiah,Kihyung Sim,Yuhao Shi,Katsumi Abe,Shigenori Ueda?,Masato Sasase,Junghwan Kim?,Hideo Hosono","Mobility?stability trade-off in oxide thin-film  transistors",,"Nature Electronics",,"Vol. 4",,"pp. 800-807",2021,Nov.
"Junghwawn Kim,Yu-Shien Shiah,Katsumi Abe,Hideo Hosono,Junghwan Kim","How to Obtain both High Mobility and High Stability in Oxide TFTs?","IUMRS-ICA 2021",,,,,,2021,Oct.
"Yu-Shien Shiah","High Performance Oxide and Iodide TFTs and CMOS",,,,,,,2021,Sept.
"Yu-Shien Shiah","High Performance Oxide and Iodide TFTs and CMOS",,,,,,,2021,Sept.
"Yu-Shien Shiah","High Performance Oxide and Iodide TFTs and CMOS",,,,,,,2021,Sept.
"Yu-Shien Shiah","High Performance Oxide and Iodide TFTs and CMOS",,,,,,,2021,Sept.
"Yu-Shien Shiah,Kihyung Sim,Shigenori Ueda,Junghwan Kim,Hideo Hosono","Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs",,"IEEE Electron Device Letters",,"Vol. 42",,"pp. 1319 - 1322",2021,July
"Cheol Hee Choi,Taikyu Kim,Shigenori Ueda,Yu-Shien Shiah,Hideo Hosono,Junghwan Kim,Jae Kyeong Jeong","High-Performance Indium Gallium Tin Oxide Transistors with an Al2O3 Gate Insulator Deposited by Atomic Layer Deposition at a Low Temperature of 150 ��C: Roles of Hydrogen and Excess Oxygen in the Al2O3 Dielectric Film",,"ACS Applied Materials and Interfaces","ACS Publications",,,,2021,June
"Tianping Ying,Tongxu Yu,Yu-Shien Shiah,Changhua Li,Jiang Li,Yanpeng Qi,Hideo Hosono","High-Entropy van der Waals Materials Formed from Mixed Metal Dichalcogenides, Halides, and Phosphorus Trisulfides",,"J. AM. CHEM. SOC.",,"  143",,"  7042-7049",2021,Apr.
"Xianzhe Liu,Jianhua Zhang,Yu-Shien Shiah,Junghwan Kim,Honglong Ning,Kuankuan Lu,Xiuhua Cao,Wei Xu,Rihui Yao,Junbiao Peng","Implementing Room-Temperature Fabrication of Flexible  Amorphous Sn?Si?O TFTs via Defect Control",,"Advanced Materials Interfaces","Wiley",,,"p. 2002193",2021,Feb.
"Junghwan Kim,Yu-Shien Shiah,Joonho Bang,Katsumi Abe,Hideo Hosono","Trade-off Relation between Mobility and Reliability in Oxide TFTs: Possible Origins and Experimental Demonstration","International Meeting on Information Display (IMID)",,,,,,2019,Aug.
"Yu-Shien Shiah,Joonho Bang,Katsumi Abe,Junghwan Kim,Hideo Hosono","NBTS-free Oxide TFTs with High Mobility of 40 cm2/Vs: A Possible Origin for NBTS Instability","Society for Information Display (SID)","SID international symposium digest of technical papers",,,,"pp. 1349-1350",2019,May
"Junghwan Kim,Yu-Shien Shiah,Joonho Bang,Katsumi Abe,Hideo Hosono","Stability Issues of High-mobility Oxide TFTs","International Thin-Film Transistor Conference (ITC) 2019","The Abstracts of the 15th ITC",,,,"p. 36",2019,Feb.