"Wei Li","A study of improvement on the charge/discharge rate of lithium ion battery focusing on electron conduction of tungsten trioxide electrodes",,,,,,,2015,Mar.
"Wei Li","A study of improvement on the charge/discharge rate of lithium ion battery focusing on electron conduction of tungsten trioxide electrodes",,,,,,,2015,Mar.
"Wei Li","A study of improvement on the charge/discharge rate of lithium ion battery focusing on electron conduction of tungsten trioxide electrodes",,,,,,,2015,Mar.
"LiWei,ฒX–ุ—บl,‘ๅ} Gs,ย–ุŽ–พ,Šp“ˆ–M”V,•ะ‰ชD‘ฅ,ผŽRฒ,™ˆไM”V,Žแ—ัฎ,“›ˆไˆ๊ถ,–ผŽๆŒค“๑,Šโˆไ—m","’PŽฮปWO3”––Œ’๏R—ฆ‚ฬ”Mˆ—ˆห‘ถซ","‘ๆ61‰๑‰ž—p•จ—Šw‰๏t‹GŠwpu‰‰‰๏",,,,,,2014,
"’†“‡ˆ๊—T,Wei Li,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,Akira Nishiyama,™ˆไM”V,KAZUO TSUTSUI,Kenji Natori,takeo hattori,HIROSHI IWAI","Interface state density measurements of 3D silicon channel by charge pumping method","G-COE PICE International Symposium and IEEE EDS Minicolloquium on Advanced Hybrid Nano Devices: Prospects by Worldfs Leading Scientists",,,,,,2013,
"’†“‡ˆ๊—T,Wei Li,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,Akira Nishiyama,™ˆไM”V,KAZUO TSUTSUI,Kenji Natori,takeo hattori,HIROSHI IWAI","Interface state density measurements of 3D silicon channel by charge pumping method","G-COE PICE International Symposium and IEEE EDS Minicolloquium on Advanced Hybrid Nano Devices: Prospects by Worldfs Leading Scientists",,,,,,2013,
"Wei Li,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,Akira Nishiyama,™ˆไM”V,KAZUO TSUTSUI,Kenji Natori,takeo hattori,HIROSHI IWAI","Interface state density measurements of 3D silicon channel by charge pumping method","G-COE PICE International Symposium and IEEE EDS Minicolloquium on Advanced Hybrid Nano Devices: Prospects by Worldfs Leading Scientists",,,,,,2013,
"Wei Li,’†“‡ˆ๊—T,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,KAZUO TSUTSUI,ผŽRฒ,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Extraction of Interface State Density of 3-dimensional Si channel","Workshop and IEEE EDS Mini-colloquium on Nanometer CMOS Technology (WIMNACT 37)",,,,,,2013,
"’†“‡ˆ๊—T,Wei Li,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,KAZUO TSUTSUI,Akira Nishiyama,Nobuyuki Sugii,Kenji Natori,takeo hattori,HIROSHI IWAI","Interface state density measurements of 3D silicon channel by charge pumping method","[550]	K. Nakajima, W. Li, K. Kakushima, P. Ahmet, K. Tsutsui, A. Nishiyama, N. Sugii, K. Natori, T. Hattori, H. Iwai, gInterface state density measurements of 3D silicon channel by charge pumping methodh, IEEE EDS MQ WIMNACT 32 C0-sponsored by EDS Japan Chapter and TIT",,,,,,2012,
"Wei Li,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,Akira Nishiyama,Nobuyuki Sugii,KAZUO TSUTSUI,Kenji Natori,takeo hattori,HIROSHI IWAI","Interface state density measurements of 3D silicon channel by conductance method","Interface state density measurements of 3D silicon channel by conductance method",,,,,,2012,
"Wei Li,’†“‡ˆ๊—T,โ…t–G,Kuniyuki KAKUSHIMA,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,Akira Nishiyama,Nobuyuki Sugii,KAZUO TSUTSUI,•ะ‰ชD‘ฅ,Kenji Natori,takeo hattori,HIROSHI IWAI","Evaluation of Interfacial State Density of MOS Capacitor with Three-Dimensional Channel by Conductance Method","CSTIC 2012",,,,,,2012,
"Soshi Sato,Wei Li,Kuniyuki KAKUSHIMA,Kenji Ohmori,KENJI NATORI,Keisaku Yamada,HIROSHI IWAI","Eatraction of additional interfacial states of silicon nanowire field-effect transistors",,"APPLIED PHYSICS LETTERS",,"Vol. 98",,,2011,June
"LiWei,Šp“ˆ–M”V,ƒp[ƒ‹ƒnƒbƒgƒAƒwƒƒg,“›ˆไˆ๊ถ,ผŽRฒ,™ˆไM”V,–ผŽๆŒค“๑,•ž•”Œ’—Y,Šโˆไ—m","ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX–@‚ษ‚ๆ‚้—ง‘ฬƒ`ƒƒƒlƒ‹‚๐—L‚ท‚้MOSƒLƒƒƒpƒVƒ^‚ฬŠE–ส€ˆส–ง“x‚ฬ•]‰ฟ","‘ๆ72‰๑‰ž—p•จ—Šw‰๏Šwpu‰‰‰๏",,,,,,2011,