"Takahiro Matsuzaki,Takamasa Kawanago,SHUNRI ODA","Impact of Contact Doping on Electrical Characteristics in WSe2 FET","The Electrochemical Society PRiME 2020",,,,,,2020,Oct.
"Kentaro Matsuura,Masaya Hamada,Takuya Hamada,Haruki Tanigawa,Takuro Sakamoto,Atsushi Hori,Iriya Muneta,Takamasa Kawanago,Kuniyuki Kakushima,Kazuo","Normally-off sputtered-MoS2 nMISFETs with TiN top-gate electrode all defined by optical lithography for chip-level integration",,"Japanese Journal of Applied Physics (JJAP) (Rapid Communication)",,"Vol. 59","No. 8","Page 80906",2020,Aug.
"�¼‰Y Œ«‘¾˜N,à_“c �¹–ç,à_“c ‘ñ–ç,’J�ì �°‹I,�â–{ ‘ñ˜N,–x “Ö,�@“c ˆÉ—�–ç,�ì“ߎq �‚’¨,Šp“ˆ –M”V,“›ˆä ˆê�¶,�¬–¸ ŒúŽu,Žá—Ñ �®","‘å–Ê�Ï�W�ω»‚ÉŒü‚¯‚½ƒXƒpƒbƒ^‘Í�σm�[ƒ}ƒŠ�[ƒIƒtMoS2-nMISFETs","‘æ67‰ñ‰ž—p•¨—�Šw‰ï�tŠúŠw�p�u‰‰‰ï",,,,,,2020,Mar.