"Arisa Kimura,Kaito Kuroki,Ryoichiro Yoshida,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Takashi Yoda,Noboru Ishihara,Hiroyuki Ito","Simulation of a ring oscillator operation during γ-ray irradiation using the TID response model of MOSFETs and its experimental verification",,"Japanese Journal of Applied Physics",,"Vol. 62",,"  SC1060",2023,Feb.
"Kaito Kuroki,Arisa Kimura,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Takashi Yoda,Noboru Ishihara,Hiroyuki Ito","Design and Fabrication Results of Z-gate Layout MOSFETs for Radiation Hardness Integrated Circuit",,"Japanese Journal of Applied Physics",,"Vol. 62","  SC1045",,2023,Jan.
"Kaito Kuroki,Arisa Kimura,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Takashi Yoda,Noboru Ishihara,Hiroyuki Ito","A Z-gate Layout MOSFET Design and Verification of Radiation Hardness against γ-ray Total Ionizing Dose Effect","International Conference on Solid State Devices and Materials","International Conference on Solid State Devices and Materials","JJAP",,,,2022,Sept.
"Arisa Kimura,Kaito Kuroki,Ryoichiro Yoshida,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Takashi Yoda,Noboru Ishihara,Hiroyuki Ito","CMOS Inverter-Base Ring Oscillator Design and Evaluation Against gray Total Ionizing Dose Effect","International Conference on Solid State Devices and Materials","International Conference on Solid State Devices and Materials",,,,,2022,Sept.
"黒木 海斗,木村 有佐,吉田 僚一郎,平川 顕二,岩瀬 正幸,小笠原 宗博,依田 孝,石原 昇,伊藤 浩之","CMOS集積回路におけるリーク電流への γ線照射の影響",,,,,,,2022,Mar.
"Takashi Yoda,Noboru Ishihara,Yuta Oshima,Motoki Ando,Kohei Kashiwagi,Ryoichiro Yoshida,Arisa Kimura,Kaito Kuroki,Shinsuke Nabeya,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Hiroyuki Ito","Total ionizing dose effect on 2-D array data transfer ICs designed and fabricated by 0.18 μm CMOS technology",,"Japanese Journal of Applied Physics",,"Vol. 61",,"  SC1081-1",2022,Mar.
"木村有佐,黒木海斗,吉田僚一郎,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","リング発振ICのγ線照射影響の回路モデル化",,,,,,,2022,Mar.
"Munehiro Ogasawara,Ryoichiro Yoshida,Yuta Oshima,Motoki Ando,Arisa Kimura,Kenji Hirakawa,Masayuki Iwase,Shinsuke Nabeya,Takashi Yoda,Noboru Ishihara,Hiroyuki Ito","Dependence of total ionizing dose effect of nMOS transistors on the on/off duty ratio of a gate voltage",,"Japanese Journal of Applied Physics",,"Vol. 60",,"  104501-1",2021,Dec.
"吉田僚一郎,木村有佐,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,石原昇,小笠原宗博,依田孝,伊藤浩之","ELT(Enclosed Layout Transistor)による耐放射線CMOS集積回路の設計","DAシンポジウム2021","情報処理学会シンポジウムシリーズ","情報処理学会",,,,2021,Sept.
"木村有佐,吉田僚一郎,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","P型とN型のFETサイズ比が異なるCMOS論理回路へのγ線照射の影響","2021年 電子情報通信学会ソサイエティ大会",,,,,,2021,Sept.
"木村有佐,吉田僚一郎,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","CMOSリング発振回路へのγ線照射の影響とその要因解析","第34回 回路とシステムのワークショップ",,,,,,2021,Aug.
"Takashi Yoda,Noboru Ishihara,Yuta Oshima,Motoki Ando,Ryoichiro Yoshida,Shinsuke Nabeya,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Hiroyuki Ito","CMOS 2-D Array Data Transfer Circuit Design and Evaluation for Use in A Radiation Environment","SSDM2021",,,,,,2021,July
"木村有佐,吉田僚一郎,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","リング発振回路におけるELTの耐放射線評価","第68回 応用物理学会春季学術講演会",,,,,,2021,Mar.
"吉田僚一郎,木村有佐,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","高累積線量におけるMOSFETのゲートバイアス特性比較","第81回 応用物理学会秋季学術講演会",,,,,,2020,Sept.
"安藤幹,大島佑太,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","CMOS論理回路におけるTIDの影響評価","2019年 電子情報通信学会総合大会",,,,,,2019,Mar.
"大島佑太,安藤幹,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","TID影響下におけるMOSFETの動的特性劣化モデルの開発","第66回 応用物理学会春季学術講演会",,,,,,2019,Mar.