@article{CTT100855476,
  author = {Junji Kataoka and Sung-Lin Tsai and Takuya Hoshii and Hitoshi Wakabayashi and Kazuo Tsutsui and Kuniyuki Kakushima},
  title = {A possible origin of the large leakage current in ferroelectric Al1-xScxN films},
  journal = {Japanese Journal of Applied Physics (JJAP) (Rapid Communication)},
  year = 2021,
}

@article{CTT100855472,
  author = {Junji Kataoka and Sung-Lin Tsai and Takuya Hoshii and Hitoshi Wakabayashi and Kazuo Tsutsui},
  title = {N-type conduction of sputter-deposited polycrystalline Al0.78Sc0.22N films by Si ion implantation},
  journal = {Applied Physics Express (APEX)},
  year = 2021,
}

@misc{CTT100844461,
  author = {Junji Kataoka},
  title = {A Study on Low Resistance Ohmic Contact for AlScN Channel MOSFET},
  year = 2021,
}

@misc{CTT100844462,
  author = {Junji Kataoka},
  title = {A Study on Low Resistance Ohmic Contact for AlScN Channel MOSFET},
  year = 2021,
}

@misc{CTT100887651,
  author = {Junji Kataoka},
  title = {A Study on Low Resistance Ohmic Contact for AlScN Channel MOSFET},
  year = 2021,
}



@phdthesis{CTT100844461,
  author = {Junji Kataoka},
  title = {A Study on Low Resistance Ohmic Contact for AlScN Channel MOSFET},
  school = {東京工業大学},
  year = 2021,
}

@phdthesis{CTT100844462,
  author = {Junji Kataoka},
  title = {A Study on Low Resistance Ohmic Contact for AlScN Channel MOSFET},
  school = {東京工業大学},
  year = 2021,
}

@phdthesis{CTT100887651,
  author = {Junji Kataoka},
  title = {A Study on Low Resistance Ohmic Contact for AlScN Channel MOSFET},
  school = {東京工業大学},
  year = 2021,
}