@article{CTT100650731,
  author = {OSAMI SAKATA and Min-Su Yi and Akifumi Matsuda and Jin Liu and Shuhei Sato and Shusaku Akiba and Atsushi Sasaki},
  title = {Structural analysis of NiO ultra-thin films epitaxially grown on ultra-wmooth sapphire substrates by synchrotron X-ray diffraction measurements},
  journal = {Applied Surface Science},
  year = 2004,
}

@article{CTT100650748,
  author = {OSAMI SAKATA and Masaki Takata and Hiroyoshi Suematsu and Akifumi Matsuda and Shusaku Akiba and Atsushi Sasaki},
  title = {High-energy X-ray Scattering in Grazing Incidence from Nanometer-scale Oxide Wires},
  journal = {Appl. Phys. Lett.},
  year = 2004,
}

@inproceedings{CTT100830478,
  author = {T. Kato and T.Inamura and A.Sasaki and K.Aoki and K.Kakushima and Y.Kataoka and A. Nishiyama and N. Sugii and H.Wakabayashi and K. Tsutsui and K. Natori and H. Iwai},
  title = {Thickness-dependent electrical characterization of β‐FeSi2},
  booktitle = {},
  year = 2014,
}

@misc{CTT100595535,
  author = {Atsushi Sasaki},
  title = {レーザーＭＢＥ法による酸化物原子層制御とエピタキシャル成長のイオン散乱分光その場解析},
  year = 2002,
}



@mastersthesis{CTT100595535,
  author = {Atsushi Sasaki},
  title = {レーザーＭＢＥ法による酸化物原子層制御とエピタキシャル成長のイオン散乱分光その場解析},
  school = {東京工業大学},
  year = 2002,
}