@article{CTT100736242,
  author = {Keisuke Ide and Mitsuho Kikuchi and Masato Ota and Masato Sasase and Hidenori Hiramatsu and Hideya Kumomi and Hideo Hosono and Toshio Kamiya},
  title = {Effects of working pressure and annealing on bulk density and nanopore structures in amorphous In–Ga–Zn–O thin-film transistors},
  journal = {Jpn. J. Appl. Phys.},
  year = 2017,
}

@inproceedings{CTT100779477,
  author = {Keisuke Ide and Masato Ota and Takayoshi Katase and Hidenori Hiramatsu and Shigenori Ueda and Hideo Hosono and Toshio Kamiya},
  title = {Depth Analysis of Near Valence Band Mximum Defect States in Amorphous Oxide Semiconductors: In-Ga-Zn-O},
  booktitle = {},
  year = 2018,
}

@inproceedings{CTT100760846,
  author = {井手 啓介 and 太田 雅人 and 岸田 陽介 and 片瀬 貴義 and 平松 秀典 and 上田 茂典 and 雲見 日出也 and 細野 秀雄 and 神谷 利夫},
  title = {[講演奨励賞受賞記念講演] 全反射硬X線光電子分光法によるアモルファス酸化物半導体の価電子帯直上欠陥の深さ方向分布},
  booktitle = {},
  year = 2018,
}

@inproceedings{CTT100760847,
  author = {K. Ide and M. Ota and T. Katase and K. Takenaka and Y. Setsuhara and A. Hiraiwa and H. Kawarada and H. Hiramatsu and H. Hosono and T. Kamiya},
  title = {Effects of film microstructures on operation characteristics of amorphous In-Ga-Zn-O thin-film transistors},
  booktitle = {},
  year = 2017,
}