@article{CTT100830585, author = {"Chunmeng Dou" and "Tomoya Shoji" and "Kazuhiro Nakajima" and "Kuniyuki Kakushima" and "Parhat Ahmet" and "Yoshinori Kataoka" and "Akira Nishiyama" and "Nobuyuki Sugii" and "Hitoshi Wakabayashi" and "Kazuo Tsutsui" and "Kenji Natori" and "Hiroshi Iwai"}, title = {Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement}, journal = {Microelectronics Reliability}, year = 2014, } @inproceedings{CTT100830485, author = {Chunmeng Dou and Kakushima and Y. Kataoka and A. Nishiyama and N. Sugii and H. Wakabayashi and K. Tsutsui and K. Natori and H. Iwai}, title = {Determination of oxide traps distribution in high-k/InGaAs MOS capacitor by capacitance-voltage measurement}, booktitle = {}, year = 2014, } @inproceedings{CTT100830553, author = {S. Kano and C. Dou and M. Hadi and K. Kakushima and P. Ahmet and A. Nishiyama and N. Sugii and K. Tsutsui and Y. Kataoka and K. Natori and E. Miranda and T. Hattori and H. Iwai}, title = {Influence of Electrode Material for CaOx Based Resistive Switching}, booktitle = {}, year = 2012, } @misc{CTT100667420, author = {Chunmeng Dou}, title = {A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction}, year = 2014, } @misc{CTT100667421, author = {Chunmeng Dou}, title = {A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction}, year = 2014, } @misc{CTT100690061, author = {Chunmeng Dou}, title = {A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction}, year = 2014, } @phdthesis{CTT100667420, author = {Chunmeng Dou}, title = {A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction}, school = {東京工業大学}, year = 2014, } @phdthesis{CTT100667421, author = {Chunmeng Dou}, title = {A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction}, school = {東京工業大学}, year = 2014, } @phdthesis{CTT100690061, author = {Chunmeng Dou}, title = {A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunction}, school = {東京工業大学}, year = 2014, }