論文

• Tadashi Shiota, Keiji Nakayama. Atom-resolved imaging of the potential distribution at Si (111) 7x7 surfaces, Japanese Journal of Applied Physics, Vol. 41, No. 10B, pp. L1178-L1180, 2002.

国際会議発表 (査読有り)

• Keiji NAKAYAMA, Tadashi SHIOTA. Nanoscopic distribution of potential and topography on Si (111) surfaces having 1x1 and 7x7 structures with and without scratching, Surface and Interface Analysis, Vol. 40, No. 1-3, p. 885-888, Mar. 2008.
• 塩田忠, 中山 景次. 走査型ケルビンプローブ顕微鏡によるSi(111)の高分解能表面電位分布観察, 第22回表面科学講演大会講演要旨集, pp. 23, 2002.

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