論文

• Yoriko Mizushima, Youngsuk Kim, Tomoji Nakamura, Akira Uedono, Takayuki Ohba. Behavior of copper contamination on backside damage for ultra-thin silicon three dimensional stacking structure, Microelectronic Engineering, ELSEVIER, Vol. 167, pp. 23-31, Jan. 2017.
• Mizushima Yoriko, Kim Youngsuk, Nakamura Tomoji, Sugie Ryuichi, Hashimoto Hideki, Uedono Akira, Ohba Takayuki. Impact of back-grinding-induced damage on Si wafer thinning for three-dimensional integration, Jpn. J. Appl. Phys., Institute of Physics, Vol. 53, No. 5, Apr. 2014.
• Akira Uedono, Yoriko Mizushima, Youngsuk Kim, Tomoji Nakamura, Takayuki Ohba, Nakaaki Yoshihara, Nagayasu Oshima, Ryoichi Suzuki. Vacancy-type defects induced by grinding of Si wafers studied by monoenergetic, Journal of Applied Physics, AIP, Vol. 116, 134501, 2014.
• Wei Zhou, Zhe Chen, Nagayasu Oshima, Kenji Ito, Brian O'Rourke, Ryunosuke Kuroda, Ryoichi Suzuki, Hiroshi Yanagishita, Takuro Tsutsui, Akira Uedono, Noriyosu Hayashizaki. In-situ characterization of free-volume holes in polymer thin films under controlled humidity conditions with an atmospheric positron probe microanalyzer, Applied Physics Letters, Vol. 101, July 2012.
• Nagayasu Oshima, Brian O'Rourke, Ryunosuke Kuroda, Ryouichi Suzuki, Hiromichi Watanabe, Shoji Kubota, Kazuki Tenjinbayashi, Akira Uedono, Noriyosu Hayashizaki. Slow Positron Beam Apparatus for Surface and Subsurface Analysis of Samples in Air, Applied Physics Express, Vol. 4, May 2011.
• S. F. Chichibu, T. Onuma, M. Kubota, A. Uedono, T. Sota, A. Tsukazaki, A. Ohtomo, M. Kawasaki. Improvements in quantum efficiency of excitonic emissions in ZnO epilayers by the elimination of point defects, Journal of Applied Physics, Vol. 99, No. 9, 093505-1-6, May 2006.  公式リンク  
  
• S. F. Chichibu, A. Uedono, A. Tsukazaki, T. Onuma, A. Ohtomo, A. Kavokin, G. Cantwell, C. W. Litton, T. Sota, M. Kawasaki. Exciton-polariton spectra and limiting factors for the room-temperature photoluminescence efficiency in ZnO, Semiconductor Science and Technology, Vol. 20, No. 4, pp. S67-S77, Apr. 2005.  公式リンク  
  

国際会議発表 (査読有り)

• Zhou Wei, Zhe Chen, Oshima Nagayasu, Ito Kenji, O'Rourke Brian E., Kuroda Ryunosuke, Suzuki Ryoichi, Yanagishita Hiroshi, Tsutsui Takuro, Uedono Akira, Hayashizaki Noriyosu. Development of a sample chamber with humidity control for an atmospheric positron probe microanalyzer, 16th International Conference on Positron Annihilation, Journal of Physics: Conference Series, Vol. 443, June 2013.

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