論文

• M. Ohtani, T. Fukumura, M. Kawasaki, K. Omote, T. Kikuchi, J. Harada, A. Ohtomo, M. Lippmaa, T. Ohnishi, D. Komiyama, R. Takahashi, Y. Matsumoto, H. Koinuma. Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films, Applied Physics Letters, Vol. 79, No. 22, pp. 3594-3596, Nov. 2001.  公式リンク  
  
• T. Ohnishi, D. Komiyama, T. Koida, S. Ohashi, C. Stauter, H. Koinuma, A. Ohtomo, M. Lippmaa, N. Nakagawa, M. Kawasaki, T. Kikuchi, K. Omote. Parallel integration and characterization of nanoscaled epitaxial lattices by concurrent molecular layer epitaxy and diffractometry, Applied Physics Letters, Vol. 79, No. 4, pp. 536-538, July 2001.  公式リンク  
  

国際会議発表 (査読有り)

• M. Ohtani, T. Fukumura, A. Ohtomo, T. Kikuchi, K. Omote, H. Koinuma, M. Kawasaki. High-throughput x-ray diffractometer for combinatorial epitaxial thin films, Materials Research Society Symposium Proceedings (edited by I. Takeuchi, J. M. Newsam, L. T. Wille, H. Koinuma and E. J. Amis), Vol. 700, pp. 125-130, Jan. 2002.

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