@article{CTT100646368,
  author = {Kiichi Tachi and N. Vulliet and S. Barraud and Kuniyuki KAKUSHIMA and HIROSHI IWAI and S. Cristoloveanu and T. Ernst},
  title = {Influence of source/drain formation process on resistance and effective mobility for scaled multi-channel MOSFET”},
  journal = {Solid-State Electronics},
  year = 2011,
}