@article{CTT100711247,
  author = {Zhengyu Xu and kouichi usami and Tomohiro Noguchi and Yukio Kawano and Teruyuki Ohashi and Takahisa Tanaka and Tsunaki Takahashi and Shunri Oda and Ken Uchida},
  title = {Experimental Study on Deformation Potential (<i>D<sub>ac</sub></i>) in MOSFETs: Demonstration of Increased <i>D<sub>ac</sub></i> at MOS Interfaces and Its Impact on Electron Mobility},
  journal = {IEEE Journal of the Electron},
  year = 2016,
}

@inproceedings{CTT100677533,
  author = {高橋綱己 and 別府伸耕 and 陳君ろ and 小田俊理 and 内田建},
  title = {バルク／SOI FinFET の自己加熱およびアナログ特性の最適化},
  booktitle = {},
  year = 2014,
}

@inproceedings{CTT100677541,
  author = {新留彩 and 高橋綱己 and 小田俊理 and 内田建},
  title = {グラフェン抵抗変化型メモリの3端子動作に関する研究},
  booktitle = {},
  year = 2014,
}

@inproceedings{CTT100664454,
  author = {新留彩 and 高橋綱己 and 小田俊理 and 内田建},
  title = {グラフェン抵抗変化型メモリのSET/RESET条件に関する研究},
  booktitle = {},
  year = 2013,
}

@inproceedings{CTT100664462,
  author = {黒澤裕也 and 角谷直哉 and 高橋綱己 and 大橋輝之 and 小田俊理 and 内田建},
  title = {不純物のイオン化エネルギー増大によるナノワイヤトランジスタの電気的特性に与える影響},
  booktitle = {},
  year = 2013,
}

@inproceedings{CTT100664465,
  author = {高橋綱己 and 小田俊理 and 内田建},
  title = {熱特性モデル化による回路中のFinFET動作温度評価手法},
  booktitle = {},
  year = 2013,
}