国際会議発表 (査読有り)

• Tsuyoshi Horikawa, Atsushi Kitamura, Masanori Yatan, Nobuhiko Nishiyama. Formulation for multiple reflection in silicon waveguide observed in OFDR depth profile, IEEE Photonics Conference, Proc. IEEE Photonics Conference, Nov. 2024.
• Tsuyoshi Horikawa, Atsushi Kitamura, Masanori Yatani, Nobuhiko Nishiyama. Extraction of Reflection Coefficient in Silicon Waveguides using Multiple Reflection Signals in OFDR, Conference on Lasers and Electro-Optics (CLEO 2024), Proceedings of Conference on Lasers and Electro-Optics (CLEO 2024), May 2024.
• Tsuyoshi Horikawa, Atsushi Kitamura, Masanori Yatani, Nobuhiko Nishiyama. Precise waveguide loss extraction using 300-mm wafer-level OFDR for optical process control monitoring, IEEE SiPhotonics 2024, Proceedings of IEEE SiPhotonics 2024, IEEE, Apr. 2024.

国内会議発表 (査読なし・不明)

• 堀川 剛, 北村 敦, 八谷 将典, 西山 伸彦. OFDR法を用いたウェーハレベル光集積デバイス特性検査 ‐細線導波路伝搬損失の高精度評価, 第84回応用物理学会秋季学術講演会, 第84回応用物理学会秋季学術講演会, 20a-A201-7, Sept. 2023.

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