@inproceedings{CTT100834859, author = {Hidekazu Takahashi and Hiroki Ogura and Shimpei Sato and Atsushi Takahashi and Chikaaki Kodama}, title = {A feature selection method for weak classifier based hotspot detection}, booktitle = {Proc. SPIE 11328, Design-Process-Technology Co-optimization for Manufacturability XIV, 113281E}, year = 2020, } @inproceedings{CTT100810028, author = {小椋弘貴 and 高橋秀和 and 佐藤真平 and 高橋篤司}, title = {ホットスポットテストケースに用いられるデータベースの分析}, booktitle = {電子情報通信学会技術研究報告}, year = 2019, } @inproceedings{CTT100810515, author = {Atsushi Takahashi and Hidekazu Takahashi and Hiroki Ogura and Shimpei Sato}, title = {Hotspot Detection Methods and their Evaluation in Advanced Lithography}, booktitle = {Proc. the 16th International SoC Design Conference (ISOCC '19)}, year = 2019, } @inproceedings{CTT100772081, author = {Atsushi Takahashi and Shimpei Sato and Hiroki Ogura and Yu-Min Sung and Ting-Chi Wang}, title = {Pattern Similarity Metrics for Layout Pattern Classification and their Validity Analysis by Lithographic Responses}, booktitle = {Proc. 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)}, year = 2018, }