@inproceedings{CTT100834859,
  author = {Hidekazu Takahashi and Hiroki Ogura and Shimpei Sato and Atsushi Takahashi and Chikaaki Kodama},
  title = {A feature selection method for weak classifier based hotspot detection},
  booktitle = {Proc. SPIE 11328, Design-Process-Technology Co-optimization for Manufacturability XIV, 113281E},
  year = 2020,
}

@inproceedings{CTT100810028,
  author = {小椋弘貴 and 高橋秀和 and 佐藤真平 and 高橋篤司},
  title = {ホットスポットテストケースに用いられるデータベースの分析},
  booktitle = {電子情報通信学会技術研究報告},
  year = 2019,
}

@inproceedings{CTT100810515,
  author = {Atsushi Takahashi and Hidekazu Takahashi and Hiroki Ogura and Shimpei Sato},
  title = {Hotspot Detection Methods and their Evaluation in Advanced Lithography},
  booktitle = {Proc. the 16th International SoC Design Conference (ISOCC '19)},
  year = 2019,
}

@inproceedings{CTT100772081,
  author = {Atsushi Takahashi and Shimpei Sato and Hiroki Ogura and Yu-Min Sung and Ting-Chi Wang},
  title = {Pattern Similarity Metrics for Layout Pattern Classification and their Validity Analysis by Lithographic Responses},
  booktitle = {Proc. 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)},
  year = 2018,
}