発明者,発明の名称,種別,状態,出願人,出願日,出願番号,公開日,公開番号,登録日,登録番号
"宇都有昭,小杉幸夫,関晴之,齋藤元也","反射率測定装置、反射率の測定方法、日射光強度の推定方法、飛行型測定装置","特許","公開","国立大学法人東京工業大学","2018/03/02","特願2018-037912","2019/09/12","特開2019-152536",,
"小杉幸夫,関晴之,宇都有昭,齋藤元也,小松　輝久","照明装置ならびにそれを用いた蛍光スペクトル画像観測装置および飛行型測定装置","特許","登録","国立大学法人東京工業大学","2017/02/27","特願2017-034320","2017/10/12","特開2017-187474","特許第6822661号","2021/01/12"
"小杉幸夫,関晴之,宇都有昭,齋藤元也,小松　輝久","センシング装置及びプラットフォーム","特許","登録","国立大学法人東京工業大学","2014/11/06","特願2015-546300","2017/03/09","再表2015/068395","特許第6525204号","2019/05/17"
"小杉幸夫,宇都有昭,関晴之,村瀬　亨　","対象物検出装置","特許","登録","国立大学法人東京工業大学, 住友電気工業株式会社","2012/06/18","特願2012-137131","2014/01/09","特開2014-002025","特許第5841498号","2015/11/20"
"小杉幸夫,宇都有昭,関晴之,村瀬　亨,高岸　成典","対象物検出装置","特許","登録","国立大学法人東京工業大学, 住友電気工業株式会社","2011/12/05","特願2011-265416","2013/06/13","特開2013-117454","特許第5845071号","2015/11/27"