Author,Title,Kind,Status,ApplicantName,ApplicationDate,ApplicationNumber,PublicationDate,PublicationNumber,RegistrationDate,RegistrationNumber
"KENJI AMAYA","状態量推定方法、状態量推定装置、及びプログラム","Patent","Registered","国立大学法人東京工業大学, 日本防蝕工業株式会社","2019/09/04","特願2019-161468","2021/03/11","特開2021-039036","特許第7255804号","2023/04/03"
"KENJI AMAYA,Yuki Nakagawa","荷重計測装置および荷重計測方法","Patent","Registered","国立大学法人東京工業大学, 曙ブレーキ工業株式会社","2018/11/21","特願2018-218355","2020/06/04","特開2020-085592","特許第7193799号","2022/12/13"
"KENJI AMAYA","角度測定装置、及び、角度測定方法","Patent","Published","国立大学法人東京工業大学, 株式会社カツラ・オプト・システムズ","2017/02/17","特願2017-027699","2018/08/23","特開2018-132475",,
"KENJI AMAYA,Yuki Nakagawa","ブレーキ圧力分布計測方法およびブレーキ圧力分布計測装置","Patent","Registered","国立大学法人東京工業大学, 曙ブレーキ工業株式会社","2016/09/21","特願2016-184471","2018/03/29","特開2018-048907","特許第6730152号","2020/07/06"
"KENJI AMAYA","ブレーキ圧力分布計測方法及びブレーキ圧力分布計測装置","Patent","Registered","国立大学法人東京工業大学, 曙ブレーキ工業株式会社","2014/11/20","特願2014-235936","2016/05/30","特開2016-098900","特許第6409226号","2018/10/05"
"KENJI AMAYA,Naoki Yoneya","金属製構造物の電気防食診断方法及び診断装置","Patent","Registered","国立大学法人東京工業大学, 日本防蝕工業株式会社, 国立研究開発法人海上･港湾･航空技術研究所","2013/02/21","特願2013-031723","2014/09/08","特開2014-162928","特許第6365862号","2018/07/13"
"KENJI AMAYA,Naoki Yoneya","金属製構造物の電気防食モニタリング方法及び装置","Patent","Registered","国立大学法人東京工業大学, 日本防蝕工業株式会社, 国立研究開発法人港湾空港技術研究所","2012/09/07","特願2012-197775","2014/03/20","特開2014-051713","特許第6120307号","2017/04/07"
"KENJI AMAYA,Natsumi Nakamura","超音波画像構成装置、超音波画像構成方法、及び超音波画像構成処理プログラム","Patent","Published","国立大学法人東京工業大学","2012/02/22","特願2012-036115","2013/09/02","特開2013-169389",,
"KENJI AMAYA,YUKI ONISHI","光学ひずみゲージ、光学的ひずみ測定装置及び光学的ひずみ測定方法","Patent","Registered","国立大学法人東京工業大学","2010/02/09","特願2010-026405","2011/08/25","特開2011-163896","特許第5408590号","2013/11/15"
"KENJI AMAYA","通電加熱方法および装置、ならびにこれを備えたプレス機械","Patent","Published","国立大学法人東京工業大学, マツダ株式会社","2009/12/17","特願2009-286205","2011/06/30","特開2011-125897",,
"KENJI AMAYA","椎間板変性の評価方法、装置及びプログラム","Patent","Published","国立大学法人東京工業大学, 学校法人北里研究所","2009/10/26","特願2009-245344","2011/05/06","特開2011-087844",,
"KENJI AMAYA","擬似スペクトル発生装置","Patent","Published","国立大学法人東京工業大学, プレサイスゲージ株式会社","2009/10/09","特願2009-234706","2011/04/21","特開2011-081274",,
"KENJI AMAYA","屈折率分布の測定装置及び測定方法","Patent","Published","国立大学法人東京工業大学","2009/10/07","特願2009-233686","2011/04/21","特開2011-080875",,
"KENJI AMAYA","金属体の断面形状測定装置","Patent","Published","国立大学法人東京工業大学","2009/10/01","特願2009-229476","2011/04/14","特開2011-075492",,
"KENJI AMAYA","超音波診断装置を用いた生体内物体の動態解析方法","Patent","Published","国立大学法人東京工業大学","2009/02/12","特願2009-030184","2010/08/26","特開2010-184040",,
"KENJI AMAYA","導電性の液体中における電極の電流測定方法及び電流測定装置","Patent","Registered","国立大学法人東京工業大学","2008/10/31","特願2008-281499","2010/05/13","特開2010-106338","特許第5463539号","2014/01/31"
"KIKUO KISHIMOTO,HIROTSUGU INOUE,KENJI AMAYA,masaki omiya","荷重推定方法","Patent","Published","国立大学法人東京工業大学, 日産自動車株式会社","2008/09/04","特願2008-227390","2010/03/18","特開2010-060462",,
"KENJI AMAYA","導電性の液体中における犠牲陽極の電流測定方法及び電流測定装置","Patent","Published","国立大学法人東京工業大学, 日置電機株式会社","2008/08/25","特願2008-214768","2010/03/04","特開2010-047814",,
"KENJI AMAYA","表面電流測定装置及び表面電流測定方法　","Patent","Registered","国立大学法人東京工業大学","2008/08/22","特願2008-214049","2010/03/04","特開2010-047811","特許第5240910号","2013/04/12"
"KENJI AMAYA","塗装された金属面の塗装状態の定量的な評価方法及びシステム","Patent","Registered","国立大学法人東京工業大学, 日置電機株式会社","2008/06/12","特願2008-154344","2009/12/24","特開2009-300228","特許第5429589号","2013/12/13"
"KENJI AMAYA,ISAO SATOH,KIKUO KISHIMOTO","測定対象物測定方法および装置","Patent","Published","国立大学法人東京工業大学, 日産自動車株式会社","2007/11/16","特願2007-298478","2009/06/04","特開2009-122050",,
"KENJI AMAYA","空間フィルタ処理を行う撮像方法及びその撮像装置","Patent","Published","国立大学法人東京工業大学","2007/07/31","特願2007-198603","2009/02/19","特開2009-038439",,
"KENJI AMAYA","合焦方法及び合焦システム","Patent","Published","国立大学法人東京工業大学, 株式会社カツラ・オプト・システムズ","2007/07/31","特願2007-198868","2009/02/19","特開2009-036824",,
"KENJI AMAYA","磁気記録再生装置、磁気記録方法、及び磁気再生方法","Patent","Published","国立大学法人東京工業大学","2007/07/30","特願2007-197726","2009/02/12","特開2009-032365",,
"KENJI AMAYA","画像解析方法","Patent","Published","国立大学法人東京工業大学","2007/07/26","特願2007-195065","2009/02/12","特開2009-031109",,
"KENJI AMAYA","電解処理における膜厚測定方法及び膜厚測定装置","Patent","Published","国立大学法人東京工業大学","2006/07/04","特願2006-184277","2008/01/24","特開2008-014699",,
"KENJI AMAYA","磁界分布計測装置","Patent","Published","国立大学法人東京工業大学","2006/03/31","特願2006-097698","2007/10/18","特開2007-271465",,
"KENJI AMAYA","電位差計測装置および電位差計測方法","Patent","Published","国立大学法人東京工業大学","2006/02/10","特願2006-033404","2007/08/23","特開2007-212326",,
"KENJI AMAYA","近接場光顕微鏡、近接場光イメージング方法、近接場光イメージング装置、近接場光イメージング法をコンピュータに実行させるプログラム、記録媒体および高密度情報記録メディア読み取り装置","Patent","Published","国立大学法人東京工業大学","2005/11/15","特願2005-330559","2007/06/07","特開2007-139466",,
"KENJI AMAYA","高解像度パターン転写方法","Patent","Registered","国立大学法人東京工業大学","2005/10/14","特願2006-543078","2008/05/22","再表2006/046475","特許第3950981号","2007/05/11"
"KENJI AMAYA","蛍光画像検出方法、蛍光画像検出基板、蛍光画像検出器、プログラムおよび記録媒体","Patent","Published","国立大学法人東京工業大学","2005/08/08","特願2005-229250","2007/02/22","特開2007-046933",,