発明者,発明の名称,種別,状態,出願人,出願日,出願番号,公開日,公開番号,登録日,登録番号
"荒川敬弘,水谷義弘,井上裕嗣,黒川悠","超音波検査方法と装置","特許","登録","国立大学法人東京工業大学, 株式会社ＩＨＩ検査計測","2005/01/18","特願2005-009804","2006/08/03","特開2006-200901","特許第4591850号","2010/09/24"