発明者,発明の名称,種別,状態,出願人,出願日,出願番号,公開日,公開番号,登録日,登録番号
"宇都有昭","光学画像装置の計測対象表面の傾斜推定法、および作物の光合成効率を推定する方法","特許","公開","国立大学法人東京工業大学","2019/09/20","特願2019-171806","2021/03/25","特開2021-047823",,
"宇都有昭,小杉幸夫,関晴之,齋藤元也","反射率測定装置、反射率の測定方法、日射光強度の推定方法、飛行型測定装置","特許","公開","国立大学法人東京工業大学","2018/03/02","特願2018-037912","2019/09/12","特開2019-152536",,
"小杉幸夫,関晴之,宇都有昭,齋藤元也,小松　輝久","照明装置ならびにそれを用いた蛍光スペクトル画像観測装置および飛行型測定装置","特許","登録","国立大学法人東京工業大学","2017/02/27","特願2017-034320","2017/10/12","特開2017-187474","特許第6822661号","2021/01/12"
"小杉幸夫,関晴之,宇都有昭,齋藤元也,小松　輝久","センシング装置及びプラットフォーム","特許","登録","国立大学法人東京工業大学","2014/11/06","特願2015-546300","2017/03/09","再表2015/068395","特許第6525204号","2019/05/17"
"小杉幸夫,宇都有昭,関晴之,村瀬　亨　","対象物検出装置","特許","登録","国立大学法人東京工業大学, 住友電気工業株式会社","2012/06/18","特願2012-137131","2014/01/09","特開2014-002025","特許第5841498号","2015/11/20"
"小杉幸夫,宇都有昭,関晴之,村瀬　亨,高岸　成典","対象物検出装置","特許","登録","国立大学法人東京工業大学, 住友電気工業株式会社","2011/12/05","特願2011-265416","2013/06/13","特開2013-117454","特許第5845071号","2015/11/27"
"小杉幸夫,宇都有昭,浅野　太郎,村瀬　亨,佐々木　吾朗,森口　雅弘","対象識別装置","特許","公開","国立大学法人東京工業大学, 住友電気工業株式会社","2009/06/17","特願2009-144648","2011/01/06","特開2011-002304",,
"宇都有昭,小杉幸夫,田中　正人,齋藤　達彦","ハイパースペクトル画像処理装置及びハイパースペクトル画像処理方法","特許","登録","国立大学法人東京工業大学, 住友電気工業株式会社","2009/04/28","特願2009-109879","2010/11/11","特開2010-256303","特許第4904377号","2012/01/13"
"小杉幸夫,宇都有昭,浅野　太郎,村瀬　亨,佐々木　吾朗,森口　雅弘","対象識別装置","特許","登録","国立大学法人東京工業大学, 住友電気工業株式会社","2009/03/19","特願2009-067709","2010/09/30","特開2010-217149","特許第5273667号","2013/05/24"
"小杉幸夫,宇都有昭,枝長　孝幸","領域抽出装置及び領域抽出方法","特許","登録","国立大学法人東京工業大学","2007/04/27","特願2007-120072","2008/11/13","特開2008-275477","特許第5026854号","2012/06/29"
"小杉幸夫,シルドマール タカハシ モンテイロ,宇都有昭,渡辺　英寿","画像処理装置及び画像処理方法","特許","登録","国立大学法人東京工業大学","2005/08/24","特願2005-242391","2006/03/30","特開2006-085688","特許第4625956号","2010/11/19"
"小杉幸夫,小俣透,高山俊男,宇都有昭","繋留型気球","特許","公開","国立大学法人東京工業大学","2005/06/24","特願2005-184601","2007/01/11","特開2007-001458",,