A machine learning scheme to determine arbitrary EEDF in atmospheric-pressure plasma from OES measurement

Publication Information

Title

Japanese:
English:	A machine learning scheme to determine arbitrary EEDF in atmospheric-pressure plasma from OES measurement

Author

Japanese:	Van Der Gaag Thijs, 赤塚洋.
English:	Thijs van der Gaag, Hiroshi Akatsuka.

Language

English

Journal/Book name

Japanese:
English:	Anstract Book of the 3rd International Conference on Data-Driven Plasma Science (ICDDPS-3)

Volume, Number, Page

pp. 25-26

Published date

Mar. 29, 2021

Publisher

Japanese:
English:	Executive Scientific Committee of the 3rd International Conference on Data-Driven Plasma Science (ICDDPS-3)

Conference name

Japanese:
English:	The 3rd International Conference on Data-Driven Plasma Science (ICDDPS-3)

Conference site

Japanese:
English:

Official URL