"Akifumi Maru,Akifumi Matsuda,Satoshi Kuboyama,Mamoru Yoshimoto","Simulation-Based Understanding of �gCharge-Sharing Phenomenon�h Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit",,"IEICE Transactions on Electronics","Institute of Electronics, Information and Communications Engineers (IEICE)","  E105.C","  1","  47-50",2022,Jan.
"Akifumi Maru","Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices",,,,,,,2021,Sept.
"Akifumi Maru","Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices",,,,,,,2021,Sept.
"Akifumi Maru","Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices",,,,,,,2021,Sept.
"Akifumi Maru,Akifumi Matsuda,MAMORU YOSHIMOTO","A Study on Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices","The 79th JSAP Autumn Meeting, 2018",,,,,,2018,Sept.
"Akifumi Maru,Akifumi Matsuda,MAMORU YOSHIMOTO","A Study of Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices","The 65th JSAP Spring Meeting, 2018",,,,,,2018,Mar.