"Takumi Uezono,Tomoyuki Takahashi,Michihiro Shintani,Kazumi Hatayama,Kazuya Masu,Hiroyuki Ochi,Takashi Sato","Scan Based Process Parameter Estimation Through Path-Delay Inequalities","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)",,,,2010,June
"Tomoyuki Takahashi,Takumi Uezono,Michihiro Shintani,Kazuya Masu,Takashi Sato","On-die parameter extraction from path-delay measurements","2009 IEEE Asian Solid-State Circuits Conference","2009 IEEE Asian Solid-State Circuits Conference","IEEE Asian Solid-State Circuits Conference",,,"pp. 101 - 104",2009,Nov.
"Michihiro Shintani,Takumi Uezono,Tomoyuki Takahashi,Hiroyuki Ueyama,Takashi Sato,Kasumi Hatayama,Takashi Aikyo,Kazuya Masu","An Adaptive Test for Parametric Faults Based on Statistical Timing Information","IEEE Asian Test Symposium","IEEE Asian Test Symposium","IEEE Asian Test Symposium",,,"pp. 151-156",2009,Nov.
"Tomoyuki Takahashi,takumi uezono,Hiroyuki Ochi,Kazuya Masu,Takashi Sato","パス遅延測定によるチップ特性の推定手法","DAシンポジウム","DAシンポジウム","DAシンポジウム",,,"pp. 133-138",2009,Aug.
"Michihiro Shintani,Tomoyuki Takahashi,Hiroyuki Ueyama,takumi uezono,Takashi Sato,Kasumi Hatayama,Takashi Aikyo,Kazuya Masu","Adaptive Test Based on Statistical Timing Information",,"2009 年 電子情報通信学会総合大会",,,,"  D-10-16",2009,Mar.
"Takumi Uezono Tomoyuki Takahashi Hiroyuki Ueyama Michihiro Shintani Takashi Sato Kazuya Masu,Tomoyuki Takahashi,Hiroyuki Ueyama,Michihiro Shintani,Takashi Sato,Kazuya Masu","Critical-Path Clustering for Adaptive Test","2009 年 電子情報通信学会総合大会","2009 年 電子情報通信学会総合大会","電子情報通信学会",,"  D-10-17","p. 160",2009,Mar.
"Tomoyuki Takahashi,Hiroyuki Ueyama,Shiho Hagiwara,Takashi Sato,Kazuya Masu","論理セル遅延の電圧・プロセスばらつき感度の検討","電子情報通信学会ソサイエティ大会","電子情報通信学会ソサイエティ大会",,,"  A-3-2","pp. 52",2008,Sept.