"Takumi Uezono,Tomoyuki Takahashi,Michihiro Shintani,Kazumi Hatayama,Kazuya Masu,Hiroyuki Ochi,Takashi Sato","Scan Based Process Parameter Estimation Through Path-Delay Inequalities","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)",,,,2010,June
"Takashi Sato,Takumi Uezono,Noriaki Nakayama,Kazuya Masu","Decomposition of Drain-Current Variation Into Gain-Factor and Threshold Voltage Variations","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)",,,,2010,May
"Takumi Uezono,Kazuya Masu,Takashi Sato","A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation",,"IEICE Transactions on Fundamentals of Electronics","IEICE Transactions on Fundamentals of Electronics","vol. E93-C","no. 3","pp. 324?331",2010,Mar.
"Tomoyuki Takahashi,Takumi Uezono,Michihiro Shintani,Kazuya Masu,Takashi Sato","On-die parameter extraction from path-delay measurements","2009 IEEE Asian Solid-State Circuits Conference","2009 IEEE Asian Solid-State Circuits Conference","IEEE Asian Solid-State Circuits Conference",,,"pp. 101 - 104",2009,Nov.
"Michihiro Shintani,Takumi Uezono,Tomoyuki Takahashi,Hiroyuki Ueyama,Takashi Sato,Kasumi Hatayama,Takashi Aikyo,Kazuya Masu","An Adaptive Test for Parametric Faults Based on Statistical Timing Information","IEEE Asian Test Symposium","IEEE Asian Test Symposium","IEEE Asian Test Symposium",,,"pp. 151-156",2009,Nov.
"Tomoyuki Takahashi,takumi uezono,Hiroyuki Ochi,Kazuya Masu,Takashi Sato","パス遅延測定によるチップ特性の推定手法","DAシンポジウム","DAシンポジウム","DAシンポジウム",,,"pp. 133-138",2009,Aug.
"Takanori Date,Shiho Hagiwara,takumi uezono,Takashi Sato,Kazuya Masu","SRAM回路の構造的対称性を考慮した2段階学習型重点的サンプリング","VLSI設計技術研究会 システム設計及び一般","VLSI設計技術研究会 システム設計及び一般，信学技報","VLSI設計技術研究会 システム設計及び一般","vol. 109","no. 34","pp. 37-42",2009,May
"Takumi Uezono,Takashi Sato,Kazuya Masu","One-Shot Voltage-Measurement Circuit Utilizing Process Variation",,"IEICE Transactions on Fundamentals of Electronics","IEICE Transactions on Fundamentals of Electronics","Vol. E92-A","No. 4","pp. 1024-1030",2009,Apr.
"Michihiro Shintani,Tomoyuki Takahashi,Hiroyuki Ueyama,takumi uezono,Takashi Sato,Kasumi Hatayama,Takashi Aikyo,Kazuya Masu","Adaptive Test Based on Statistical Timing Information",,"2009 年 電子情報通信学会総合大会",,,,"  D-10-16",2009,Mar.
"Takumi Uezono Tomoyuki Takahashi Hiroyuki Ueyama Michihiro Shintani Takashi Sato Kazuya Masu,Tomoyuki Takahashi,Hiroyuki Ueyama,Michihiro Shintani,Takashi Sato,Kazuya Masu","Critical-Path Clustering for Adaptive Test","2009 年 電子情報通信学会総合大会","2009 年 電子情報通信学会総合大会","電子情報通信学会",,"  D-10-17","p. 160",2009,Mar.
"Shiho Hagiwara,Takumi Uezono,Takashi Sato,Kazuya Masu","Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network",,"IEICE Transactions on Fundamentals of Electronics",,"Vol. E91-A","No. 5","pp. 951-956",2008,Apr.
"takumi uezono,Takashi Sato,Kazuya Masu","プロセスばらつきの積極的活用による非繰返し電圧波形の測定","第21回 回路とシステム軽井沢ワークショップ","第21回 回路とシステム軽井沢ワークショップ",,,,"pp. 439-444",2008,Apr.
"Takumi Uezono,Takashi Sato,Kazuya Masu","電源電圧降下の時間的・空間的広がり可視化手法","電子情報通信学会ソサイエティ大会",,,,"No. C-12-6",,2007,Sept.
"unknown unknown,Takashi Sato,Kazuya Masu","電源電圧降下の時間的・空間的広がり可視化回路","VDECデザイナーフォーラム",,,,,,2007,Sept.
"Takashi Sato,Shiho Hagiwara,Takumi Uezono,Kazuya Masu","Weakness identification for effective repair of power distribution network","17th International workshop on power and timing modeling, optimization and simulation (PATMOS)",,,,,"pp. 222-231",2007,Sept.
"Shiho Hagiwara,Takumi Uezono,Takashi Sato,Kazuya Masu","相関係数にもとづく回帰分析の電源改善への適用","第20回 回路とシステム軽井沢ワークショップ",,,,,"pp. 45-50",2007,Apr.
"Shuhei Amakawa,unknown unknown,Takashi Sato,Kazuya Masu","セル間接続方向限定性とセル配置粗密性を考慮した配線長分布","電子情報通信学会 総合大会",,,,"No. A-3-19","pp. 109",2007,Mar.
"Shiho Hagiwara,unknown unknown,Takashi Sato,Kazuya Masu","電源電圧降下の相関を用いる電源網の定量的評価","電子情報通信学会 総合大会",,,,"No. A-3-7",,2007,Mar.
"Takashi Sato,Takumi Uezono,Shiho Hagiwara,Kenichi Okada,Shuhei Amakawa,Noriaki Nakayama,Kazuya Masu","A MOS transistor-array for accurate measurement of subthreshold leakage variation","International Symposium on Quality Electronic Design (ISQED)",,,,,"pp. 21-26",2007,Mar.
"Shiho Hagiwara,Takumi Uezono,Takashi Sato,Kazuya Masu","Improvement of power distribution network using correlation-based regression analysis","Great Lakes Symposium on VLSI (GLSVLSI)",,,,,"pp. 513-516",2007,Mar.