"Suhyun Kim,Yoshifumi Oshima,Yasumasa Tanishiro,Kunio Takayanagi","Study on probe current dependence of the intensity distribution in annular dark field images",,"ULTRAMICROSCOPY",,"Vol. 121",,"pp. 38-41",2012,June
"K. Takayanagi,S. Kim,S. Lee,Y. Oshima,T. Tanaka,Y. Tanishiro,H. Sawada,F. Hosokawa,T. Tomita,T. Kaneyama,Yukihito Kondo","Electron microscopy at a sub-50 pm resolution",,"J. Electron Microsc.","Oxford Journals","Vol. 60","No. suppl 1","pp. S239 - S244",2011,Aug.
"S. Kim,Y. Oshima,H. Sawada,T. Kaneyama,Y. Kondo,M. Takeguchi,Yoshiko Nakayama,Y. Tanishiro,K. Takayanagi","Quantitative Annular Dark-field STEM Images of a Silicon Crystal Using a Large-angle Convergent Electron Probe with a 300-kV Cold Field-emission Gun",,"J. Electron Microsc.","Oxford Journals","Vol. 60","No. 2","pp. 109-116",2011,Jan.
"Suhyun Kim,Yoshifumi Oshima,Hidetaka Sawada,Naoto Hashikawa,Kyoichiro Asayama,Tosikatu Kaneyama,Yukihito Kondo,Yasumasa Tanishiro,Kunio Takayanagi","A Dopant Culster in a Highly Antimony Doped Silicon Crystal",,"Applied Physics Express","The Japan Society of Applied Physics","Vol. 3","No. 8","p. 081301",2010,July