"Akifumi Maru,Akifumi Matsuda,Satoshi Kuboyama,Mamoru Yoshimoto","Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit",,"IEICE Transactions on Electronics","Institute of Electronics, Information and Communications Engineers (IEICE)","  E105.C","  1","  47-50",2022,Jan.
"Akifumi Maru","Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices",,,,,,,2021,Sept.
"Akifumi Maru","Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices",,,,,,,2021,Sept.
"Akifumi Maru","Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices",,,,,,,2021,Sept.
"丸明史,松田晃史,吉本護","微細半導体プロセスにおける宇宙空間シングルイベント耐性強化技術の検討（２）","2018年 第79回 応用物理学会秋季学術講演会",,,,,,2018,Sept.
"丸明史,松田晃史,吉本護","微細半導体プロセスにおけるシングルイベント耐性強化技術の検討","2018年 第65回 応用物理学会春季学術講演会",,,,,,2018,Mar.