"Sou Ryuzaki,Takeshi Hasegawa,Jun Onoe","X-ray diffraction and infrared multiple-angle incidence resolution spectroscopic studies on the crystal structure and molecular orientation of Zinc-porphyrin thin films on a SiO<sub>2</sub>Si substrate",,"J. Appl. Phys.","American Institute of Physics","Vol. 105",,"  113529",2009,June