"Takashi Yoda,Noboru Ishihara,Yuta Oshima,Motoki Ando,Kohei Kashiwagi,Ryoichiro Yoshida,Arisa Kimura,Kaito Kuroki,Shinsuke Nabeya,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Hiroyuki Ito","Total ionizing dose effect on 2-D array data transfer ICs designed and fabricated by 0.18 μm CMOS technology",,"Japanese Journal of Applied Physics",,"Vol. 61",,"  SC1081-1",2022,Mar.
"Munehiro Ogasawara,Ryoichiro Yoshida,Yuta Oshima,Motoki Ando,Arisa Kimura,Kenji Hirakawa,Masayuki Iwase,Shinsuke Nabeya,Takashi Yoda,Noboru Ishihara,Hiroyuki Ito","Dependence of total ionizing dose effect of nMOS transistors on the on/off duty ratio of a gate voltage",,"Japanese Journal of Applied Physics",,"Vol. 60",,"  104501-1",2021,Dec.
"木村有佐,吉田僚一郎,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","P型とN型のFETサイズ比が異なるCMOS論理回路へのγ線照射の影響","2021年 電子情報通信学会ソサイエティ大会",,,,,,2021,Sept.
"吉田僚一郎,木村有佐,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,石原昇,小笠原宗博,依田孝,伊藤浩之","ELT(Enclosed Layout Transistor)による耐放射線CMOS集積回路の設計","DAシンポジウム2021","情報処理学会シンポジウムシリーズ","情報処理学会",,,,2021,Sept.
"木村有佐,吉田僚一郎,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","CMOSリング発振回路へのγ線照射の影響とその要因解析","第34回 回路とシステムのワークショップ",,,,,,2021,Aug.
"Takashi Yoda,Noboru Ishihara,Yuta Oshima,Motoki Ando,Ryoichiro Yoshida,Shinsuke Nabeya,Kenji Hirakawa,Masayuki Iwase,Munehiro Ogasawara,Hiroyuki Ito","CMOS 2-D Array Data Transfer Circuit Design and Evaluation for Use in A Radiation Environment","SSDM2021",,,,,,2021,July
"木村有佐,吉田僚一郎,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","リング発振回路におけるELTの耐放射線評価","第68回 応用物理学会春季学術講演会",,,,,,2021,Mar.
"吉田僚一郎,木村有佐,安藤幹,大島佑太,鍋屋信介,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","高累積線量におけるMOSFETのゲートバイアス特性比較","第81回 応用物理学会秋季学術講演会",,,,,,2020,Sept.
"安藤幹,大島佑太,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","CMOS論理回路におけるTIDの影響評価","2019年 電子情報通信学会総合大会",,,,,,2019,Mar.
"大島佑太,安藤幹,平川顕二,岩瀬正幸,小笠原宗博,依田孝,石原昇,伊藤浩之","TID影響下におけるMOSFETの動的特性劣化モデルの開発","第66回 応用物理学会春季学術講演会",,,,,,2019,Mar.