"Masahiro Inaba,Soichiro Todoroki,Kazuyoshi Nakada,Shinsuke Miyajima","Temperature-dependent minority carrier lifetime of crystalline silicon wafers passivated by high quality amorphous silicon oxide",,"Japanese Journal of Applied Physics",,"Vol. 55",,"pp. 04ES04",2016,Mar. "Masahiro Inaba,Soichiro Todoroki,Kazuyoshi Nakada,Shinsuke Miyajima","Temperature-Dependent Minority Carrier Lifetime of Crystalline Silicon Wafers Passivated by High Quality Amorphous Silicon Oxide","2015 International Conference on Solid State Devices and Materials",,,,,,2015,Sept. "ˆî—t^G,Œ@ˆê˜Y,’†“c˜a‹g,‹{“‡W‰î","‰·“x‰Â•ÏQSSPC–@‚É‚æ‚錋»ƒVƒŠƒRƒ“‚̃pƒbƒVƒx[ƒVƒ‡ƒ“–Œ•]‰¿","‘æ12‰ñ uŽŸ¢‘ã‚Ì‘¾—zŒõ”­“dƒVƒXƒeƒ€vƒVƒ“ƒ|ƒWƒEƒ€",,,,,,2015,May "‚‹´ ´,Œ @ˆê˜Y,‹{“‡ W‰î","V‹KƒAƒ‹ƒ~ƒjƒEƒ€Œ¹‚É‚æ‚éŽ_‰»ƒAƒ‹ƒ~ƒjƒEƒ€–Œ‚ÌŒ`¬‚Æ‘¾—z“d’r‰ž—p","‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï",,,,,,2015,Mar.