"Hiroto Nakayama,Kuniyuki KAKUSHIMA,Ahmet Parhat,E.Ikenaga,KAZUO TSUTSUI,Nobuyuki Sugii,takeo hattori,HIROSHI IWAI","Crystallographic Orientation Dependent Electrical Characteristics of La2O3 MOS Capacitors","ECS 216th Meeting",,,"vol. 25","No. 6","pp. 339-345",2009,Oct.
"Hiroto Nakayama,Kuniyuki KAKUSHIMA,Ahmet Parhat,E.Ikenaga,KAZUO TSUTSUI,Nobuyuki Sugii,takeo hattori,HIROSHI IWAI","Crystallographic Orientation Dependent Electrical Characteristics of La2O3 MOS Capacitors","G-COE PICE International Symposium on Silicon Nano Devices",,,,,,2009,Oct.
"中山寛人,日野雅文,永田晃基,小瀬村大亮,角嶋邦之,パールハットアヘメト,筒井一生,杉井信之,小椋厚志,服部健雄,岩井洋","As注入とSiN応力膜によるpoly-Siへの歪記憶の検討","第56回応用物理学関係連合講演会","第56回応用物理学関係連合講演会予稿集","応用物理学会",,"No. 2","pp. 869",2009,Mar.
"H. Nakayama,K. Kakushima,P. Ahmet,K. Tsutsui,N. Sugii,T. Hattori,H. Iwai","Electrical Characteristics of La2O3 Gated MOS Capacitors with Different Wafer Orientation","216th ECS Meeting",,,,,,2009,
"中山寛人,日野雅文,服部健雄,杉井信之,筒井一生,パールハットアヘメト,角嶋邦之,小椋厚志,永田 晃基,吉田 哲也,小瀬村大亮,岩井洋","Ar注入とSiN応力膜によるパターン付Si基板への歪記憶技術の検討","秋季第69回応用物理学会学術講演会","応用物理学会","応用物理学会",,"No. 2","pp. 743",2008,Sept.