"Takumi Uezono,Tomoyuki Takahashi,Michihiro Shintani,Kazumi Hatayama,Kazuya Masu,Hiroyuki Ochi,Takashi Sato","Scan Based Process Parameter Estimation Through Path-Delay Inequalities","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)",,,,2010,June
"Takashi Sato,Takumi Uezono,Noriaki Nakayama,Kazuya Masu","Decomposition of Drain-Current Variation Into Gain-Factor and Threshold Voltage Variations","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)","IEEE International Symposium on Circuits and Systems (ISCAS 2010)",,,,2010,May
"Takumi Uezono,Kazuya Masu,Takashi Sato","A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation",,"IEICE Transactions on Fundamentals of Electronics","IEICE Transactions on Fundamentals of Electronics","vol. E93-C","no. 3","pp. 324?331",2010,Mar.
"Tomoyuki Takahashi,Takumi Uezono,Michihiro Shintani,Kazuya Masu,Takashi Sato","On-die parameter extraction from path-delay measurements","2009 IEEE Asian Solid-State Circuits Conference","2009 IEEE Asian Solid-State Circuits Conference","IEEE Asian Solid-State Circuits Conference",,,"pp. 101 - 104",2009,Nov.
"Michihiro Shintani,Takumi Uezono,Tomoyuki Takahashi,Hiroyuki Ueyama,Takashi Sato,Kasumi Hatayama,Takashi Aikyo,Kazuya Masu","An Adaptive Test for Parametric Faults Based on Statistical Timing Information","IEEE Asian Test Symposium","IEEE Asian Test Symposium","IEEE Asian Test Symposium",,,"pp. 151-156",2009,Nov.
"高橋知之,上薗巧,越智裕之,益一哉,佐藤高史","パス遅延測定によるチップ特性の推定手法","DAシンポジウム","DAシンポジウム","DAシンポジウム",,,"pp. 133-138",2009,Aug.
"伊達貴徳,萩原 汐,上薗 巧,佐藤高史,益 一哉","SRAM回路の構造的対称性を考慮した2段階学習型重点的サンプリング","VLSI設計技術研究会 システム設計及び一般","VLSI設計技術研究会 システム設計及び一般，信学技報","VLSI設計技術研究会 システム設計及び一般","vol. 109","no. 34","pp. 37-42",2009,May
"Takumi Uezono,Takashi Sato,Kazuya Masu","One-Shot Voltage-Measurement Circuit Utilizing Process Variation",,"IEICE Transactions on Fundamentals of Electronics","IEICE Transactions on Fundamentals of Electronics","Vol. E92-A","No. 4","pp. 1024-1030",2009,Apr.
"新谷 道広,高橋 知之,植山 寛之,上薗 巧,佐藤 高史,畠山 一実,相京 隆,益 一哉","統計的タイミング情報に基づく適応型テスト",,"2009 年 電子情報通信学会総合大会",,,,"  D-10-16",2009,Mar.
"上薗 巧,高橋 知之,植山 寛之,新谷 道広,佐藤 高史,益 一哉","適応型テストにおけるクリティカルパスのクラスタリング手法","2009 年 電子情報通信学会総合大会","2009 年 電子情報通信学会総合大会","電子情報通信学会",,"  D-10-17","p. 160",2009,Mar.
"Shiho Hagiwara,Takumi Uezono,Takashi Sato,Kazuya Masu","Application of Correlation-based Regression Analysis for Improvement of Power Distribution Network",,"IEICE Transactions on Fundamentals of Electronics",,"Vol. E91-A","No. 5","pp. 951-956",2008,Apr.
"上薗巧,佐藤高史,益 一哉","プロセスばらつきの積極的活用による非繰返し電圧波形の測定","第21回 回路とシステム軽井沢ワークショップ","第21回 回路とシステム軽井沢ワークショップ",,,,"pp. 439-444",2008,Apr.
"上薗巧,佐藤高史,益一哉","電源電圧降下の時間的・空間的広がり可視化手法","電子情報通信学会ソサイエティ大会",,,,"No. C-12-6",,2007,Sept.
"上薗巧,佐藤高史,益一哉","電源電圧降下の時間的・空間的広がり可視化回路","VDECデザイナーフォーラム",,,,,,2007,Sept.
"Takashi Sato,Shiho Hagiwara,Takumi Uezono,Kazuya Masu","Weakness identification for effective repair of power distribution network","17th International workshop on power and timing modeling, optimization and simulation (PATMOS)",,,,,"pp. 222-231",2007,Sept.
"萩原汐,上薗巧,佐藤高史,益 一哉","相関係数にもとづく回帰分析の電源改善への適用","第20回 回路とシステム軽井沢ワークショップ",,,,,"pp. 45-50",2007,Apr.
"天川 修平,上薗 巧,佐藤 高史,益 一哉","セル間接続方向限定性とセル配置粗密性を考慮した配線長分布","電子情報通信学会 総合大会",,,,"No. A-3-19","pp. 109",2007,Mar.
"萩原 汐,上薗 巧,佐藤 高史,益 一哉","電源電圧降下の相関を用いる電源網の定量的評価","電子情報通信学会 総合大会",,,,"No. A-3-7",,2007,Mar.
"Takashi Sato,Takumi Uezono,Shiho Hagiwara,Kenichi Okada,Shuhei Amakawa,Noriaki Nakayama,Kazuya Masu","A MOS transistor-array for accurate measurement of subthreshold leakage variation","International Symposium on Quality Electronic Design (ISQED)",,,,,"pp. 21-26",2007,Mar.
"Shiho Hagiwara,Takumi Uezono,Takashi Sato,Kazuya Masu","Improvement of power distribution network using correlation-based regression analysis","Great Lakes Symposium on VLSI (GLSVLSI)",,,,,"pp. 513-516",2007,Mar.