"堀口 剛司,杉本 貴之,冨永 真志,漆畑 廣明,藤田 英明,赤木 泰文,木ノ内 伸一,大井 健史","物理モデルに基づく並列接続pinダイオードのリカバリー特性解析",,"電気学会論文誌D","電気学会","vol. 132","no. 5","pp. 566-573",2012,May
"岩田恭彰,冨永真志,藤田英明,赤木泰文,堀口剛司,木ノ内伸一,大井健史,漆畑廣明","高精度MOSFETモデルを用いた損失・ノイズ評価への基礎的検討","産業応用部門大会","電気学会 産業応用部門大会","電気学会","Vol. 1","no. 1-135","pp. 615-618",2011,Sept.
"Shinji Tominaga,Hiroaki Urushibata,Hideaki Fujita,Hirofumi Akagi,Takeshi Horiguchi,Shin-ichi Kinouchi,Takeshi Oi","Modeling of IGBTs with Focus on Voltage Dependency of Terminal Capacitances","European Conference on Power Electronics and Applications","Proceedings of European Conference on Power Electronics and Applications","IEEE",,,"pp. 1-9",2011,Aug.
"遠山 喬,冨永 真志,漆畑 廣明,藤田 英明,赤木 泰文,木ノ内 伸一,大井 健史","静特性と動特性の統合評価に基づくパラメータ抽出手法",,"電気学会論文誌D","電気学会","vol. 131","no. 7","pp. 864-872",2011,July
"杉本 貴之,冨永 真志,漆畑 廣明,藤田 英明,赤木 泰文,堀口 剛司,木ノ内 伸一,大井 健史","デバイスモデルを用いた並列接続pinダイオードの動作特性 ―キャリアの挙動によるリカバリー特性の解析―","半導体電力変換研究会","電気学会研究会資料",,,"no. SPC-11-017","pp. 97-102",2011,Jan.
"杉本貴之,冨永真志,漆畑廣明,藤田英明,赤木泰文,木ノ内伸一,大井健史","デバイスモデルを用いた並列接続pinダイオードのリカバリー特性解析","産業応用部門大会","電気学会 産業応用部門大会","電気学会","Vol. 1",,"pp. 375-376",2010,Aug.
"遠山 喬,冨永真志,漆畑廣明,藤田英明,赤木泰文,木ノ内伸一,大井健史","静特性と動特性の統合評価に基づくパラメータ抽出手法 ―pinダイオードモデルへの応用―","電気学会 半導体電力変換研究会","電気学会 半導体電力変換研究会資料",,,"No. SPC-10-015","pp. 89-94",2010,Jan.
"遠山喬,冨永真志,漆畑廣明,藤田英明,赤木泰文,木ノ内伸一,大井健史","pinダイオードモデルにおけるライフタイム分布の影響","産業応用部門大会","電気学会 産業応用部門大会","電気学会","Vol. 1",,"pp. 415-418",2009,Aug.
"Rina Maeda,Teruaki Hayakawa,Masatoshi Tokita,Ryohei Kikuchi,Jun Kouki,MASA-AKI KAKIMOTO,hiroaki urushibata","Double liquid crystalline side-chain type block copolymers for hierarchically ordered nanostructures: Synthesis and morphologies in the bulk and thin film",,"Reactive & Functional Polymers","Elsevier Ltd.","Vol. 69",,"Page 519-529",2009,May
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