"ŽRθ—z‘Ύ˜Y,‘κΰV‹g—Y,·‰ͺOK,•“c ƒJƒ‹ƒƒX΄ˆκ","MEA’f–Κ‚Μ”χΧ\‘’ŠΟŽ@—pŽŽ—Ώƒzƒ‹ƒ_[‚ΜŠJ”­","‘ζ4‰ρ‘Ϋ…‘fE”R—Ώ“d’r“Wi‚e‚b EXPO 2008j",,,,,,2008,June
"’†μ‹M,“c’†rs,“‡’Γ—²ˆκ,Žu‘Ί‘ρ^,‹ΰŠΫr,•“cƒJƒ‹ƒƒX΄ˆκ,‘½“c‘ε,”Ό“cG,ˆ’•”³‹I","ƒoƒCƒIƒƒfƒBƒJƒ‹‰ž—p‚π–ΪŽw‚΅‚½FeƒXƒsƒlƒ‹ƒiƒmƒr[ƒY‚̍쐻",,"“ϊ–{ƒZƒ‰ƒ~ƒbƒNƒX‹¦‰ο‘ζ‚Q‚O‰ρH‹GƒVƒ“ƒ|ƒWƒEƒ€u‰‰—\eW",,,,"  45",2007,Sept.
"Karurosu Seiichi Kuroda,Yohtaro Yamazaki","Novel Technique of MEA Sample Perparation Using a Focused Ion Beam for Scanning Electron Microscope Investigation",,"ECS  Transaction",,"Vol. 11","No. 1","pp. 509-516",2007,