"�¯–쌛•¶,’†�싱�¬,–약”ŽŽi,Žº —²Œj”V,‰Á“¡ —L��Žq,�b”ã—²�s,‹à�¬�‘,ƒp�[ƒ‹ƒnƒbƒgƒAƒwƒ�ƒg,Šp“ˆ–M”V,�…–앶“ñ,–؉º –L•F,“›ˆäˆê�¶,•ž•”Œ’—Y,Šâˆä—m","Œõ“dŽq•ªŒõ‚É‚æ‚éSi’†As‚̉»ŠwŒ‹�‡�ó‘Ô•]‰¿","‘æ56‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï","‘æ56‰ñ‰ž—p•¨—�ŠwŠÖŒW˜A�‡�u‰‰‰ï—\�e�W","‰ž—p•¨—�Šw‰ï",,"No. 2","pp. 883",2009,Mar.
"’†�싱�¬,–약”ŽŽi,ŽðˆäˆêŒ›,‰¡“c ’m”V,�b”ã —²�s,‹à�¬�‘,ƒp�[ƒ‹ƒnƒbƒgƒAƒwƒ�ƒg,Šp“ˆ–M”V,�…–앶“ñ,•ž•”Œ’—Y,“›ˆäˆê�¶,Šâˆä—m","Œõ“dŽq•ªŒõ‚É‚æ‚éSi’†As‚ÌŠˆ�«‰»�ó‘Ô‚Ì�[‚³•ûŒü•ª•z•]‰¿","�H‹G‘æ69‰ñ‰ž—p•¨—�Šw‰ïŠw�p�u‰‰‰ï","‰ž—p•¨—�Šw‰ï","‰ž—p•¨—�Šw‰ï",,"No. 2","pp. 738",2008,Sept.
"Kazuo Tsutsui,Masamitsu Watanabe,Yasumasa Nakagawa,Kazunori Sakai,Takayuki Kai,Cheng-Guo Jin,Yuichiro Sasaki,Kuniyuki Kakushima,Parhat Ahmet,Bunji Mizuno,Takeo Hattori,Hiroshi Iwai.","Profiling of Carrier Properties for Shallow Junctions Using a New Sub-nanometer Step-by-step Etching Technique","The 8th International Workshop on Junction Technology (IWJT2008)",,,,,,2008,May