"M. Ohtani,T. Fukumura,A. Ohtomo,T. Kikuchi,K. Omote,H. Koinuma,M. Kawasaki","High-throughput x-ray diffractometer for combinatorial epitaxial thin films",,"Materials Research Society Symposium Proceedings (edited by I. Takeuchi, J. M. Newsam, L. T. Wille, H. Koinuma and E. J. Amis)",,"Vol. 700",,"pp. 125-130",2002,Jan.
"M. Ohtani,T. Fukumura,M. Kawasaki,K. Omote,T. Kikuchi,J. Harada,A. Ohtomo,M. Lippmaa,T. Ohnishi,D. Komiyama,R. Takahashi,Y. Matsumoto,H. Koinuma","Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films",,"Applied Physics Letters",,"Vol. 79","No. 22","pp. 3594-3596",2001,Nov.
"T. Ohnishi,D. Komiyama,T. Koida,S. Ohashi,C. Stauter,H. Koinuma,A. Ohtomo,M. Lippmaa,N. Nakagawa,M. Kawasaki,T. Kikuchi,K. Omote","Parallel integration and characterization of nanoscaled epitaxial lattices by concurrent molecular layer epitaxy and diffractometry",,"Applied Physics Letters",,"Vol. 79","No. 4","pp. 536-538",2001,July