"M. Mamatrishat,Miyuki Kouda,Takamasa Kawanago,Kuniyuki KAKUSHIMA,Ahmet Parhat,A. Aierken,KAZUO TSUTSUI,���R��,Nobuyuki Sugii,KENJI NATORI,HIROSHI IWAI","Effect of Remote-Surface ?Roughness Scattering on Electron Mobility in MOSFETs with High-k Dielectrics","ECS 218th Meeting",,,,,,2010,Oct.