"Kenji Ohmori,W. Feng,Soshi Sato,R. Hettiarachchi,M. Sato,T. Matsuki,Kuniyuki KAKUSHIMA,HIROSHI IWAI,Keisaku Yamada","Direct Real-Time Observation of Channel Potential Fluctuation, Correlated to Random Telegraph Noise of Drain Current Using Nanowire MOSFETs with Four-Probe Terminals","2011 Symposium on VLSI Technology",,,,,,2011,