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"Yasuyuki Oishi,Shigekazu Kimura,Eisuke Fukuda,Takeshi Takano,Yoshimasa Daido,Kiyomichi Araki","Iterative Determination of Phase Reference in IMD Measurement to Characterize Nonlinear Behavior, and to Derive Inverse, for Power Amplifier with Memory Effect",,"IEICE Transaction on Electronics",,"Vol. E94-C","No. 10","pp. 1515-1523",2011,Oct.
"Takeshi Takano,Yasuyuki Oishi,Toru Maniwa,Hiroyuki Hayashi,Toshihide Kikkawa,Kiyomichi Araki","Drain-Voltage Dependency of Memory Effects in W-CDMA Base Station Digital Predistortion Linearizers with Compound Semiconductor Power Amplifiers",,"MICROWAVE AND OPTICAL TECHNOLOGY LETTERS",,"Vol. 45","No. 6","pp. 551-554",2005,June
"T.Takano,T.Maniwa,Y.Oishi,K.Araki","Influence of Frequency Characteristics of RF Circuits in DIgital Predistortion Type Linearizer System on Adjacent Channel Leakage Ratio for W-CDMA Power Amplifier",,"IEICE Transaction on Fundamentals",,"Vol. E87-A","No. 2","pp. 324-329",2004,Feb.