"Shuhei Hosoda,K. Tuokedaerhan,Kuniyuki KAKUSHIMA,�Љ��D��,���R��,Nobuyuki Sugii,Hitoshi Wakabayashi,KAZUO TSUTSUI,Kenji Natori,HIROSHI IWAI","Reliability of La-silicate MOS capacitors with tungsten carbide gate electrode for scaled EOT","ECS 224nd Meeting","ECS Transactions",,"Vol. 58","No. 7","pp. 61-64",2013,Oct.