"M. Nishizawa,T. Hoshii,H. Wakabayashi,K. Tsutsui,Yoshiaki Daigo,Ichiro Mizushima,T. Yoda,K. Kakushima","Minority carrier lifetime extraction methodology based on parallel pn diodes with a field plate",,"Japanese Journal of Applied Physics",,"Vol. 61",,"  SH1011",2022,June
"•xΰV I,μγ Œ«l,ŸNˆδ Ζ•v,‘κ ²,‰ͺ–{ ’Ό–η,–FΌ Ž‘₯,‘ηŒν ‰ΐ–Ύ,…“‡ ˆκ˜Y,ˆΛ“c F,Š¦μ ‹`—T,Š`–{ _ˆκ,”’Ξ Œ«“ρ","cŒ^Œ‹»¬’·‘•’u‚Ι‚¨‚―‚ιGaN MOVPEƒVƒ~ƒ…ƒŒ[ƒVƒ‡ƒ“","‘ζ66‰ρ‰ž—p•¨—Šw‰οtŠϊŠwpu‰‰‰ο",,,,,,2019,Mar.